Fred Stevie's Secondary ion mass spectrometry : applications for depth PDF

By Fred Stevie

This publication was once written to provide an explanation for a strategy that calls for an knowing of many info so as to thoroughly receive and interpret the knowledge bought. It will also function a reference in the event you have to supply SIMS information. The ebook has over 2 hundred figures and the references let one to track improvement of SIMS and comprehend the various info of the strategy

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1983. ” In Applied Atomic Collision Physics, ed. S. Datz, 327. New York: Academic Press. W. Mayer. 1985. ” In Fundamentals of Surface and ­ Thin Film ­Analysis, eds. C. W. Mayer, 69. New York: North-Holland. G. 1986. ” In Metals Hand­ book Ninth Edition, Vol. 10—Materials Characterization, ed. E. Whan, 610. American Society for Metals, Materials Park. K. 1992. ” In Ency­ clopedia of Materials Characterization—Surfaces, Interfaces, and Thin Films, eds. R. A. Evans, Jr. and S. Wilson, 532. Boston, MA: ­Butterworth-Heinemann.

64] van der Heide, P. 2014. Secondary Ion Mass Spectrometry: An Introduction to Principles and Practices. New York: Wiley. A. 1975. ” In Methods of Surface Analysis, ed. W. Czanderna, 223. Amsterdam, Netherlands: ­Elsevier. [66] Blaise, G. 1976. ” In Material Characterization Using Ion Beams, eds. P. Thomas, and A. Cachard, 143. London, United Kingdom: Plenum Press. W. 1978. ” In Electron and Ion Spectroscopy of Solids, eds. L. Fiermans, J.  Dekeyser, 324. New York: Plenum Press. [68] Williams, P.

Berlin, Germany: Springer Verlag. , J. Okano, R. W. Werner, eds. 1984. Second­ ary Ion Mass Spectrometry, SIMS IV. Berlin, Germany: Springer Verlag. J. S. W. Werner, eds. 1986. Secondary Ion Mass Spectrometry, SIMS V. Berlin, Germany: Springer ­Verlag. M. W. Werner, eds. 1988. Secondary Ion Mass Spectrometry, SIMS VI. Chichester, United Kingdom: Wiley. A. D. A.  Werner, eds. 1990. Secondary Ion Mass Spectrometry, SIMS VII. Chichester, United Kingdom: Wiley. F. Janssen, J. W. Werner, eds. 1992. Secondary Ion Mass Spectrometry, SIMS VIII.

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